AIM-9000 - 应用

Discontinued

Automatic Failure Analysis System

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电子电器

此处是电子器件端子上附着异物的分析例。利用大视野相机，观察器件整体，决定对哪个部位进行测量。对薄的污渍或小的外来异物，反射方法谱图质量不好时，可以考虑使用Ge晶体的显微ATR测量。

机械和运输

此处是长期暴露在日光下的树脂部件分析例。通过对部件截面红外光谱的测量，深度方向上的降解程度实现了可视化。

制药和生命科学

此处是附着在药片表面异物的分析例。通过挑入金刚石池中进行挤压，可以对不同形状的样品进行显微透射测量。

石油化工

此处是薄膜偏振分析的例子。利用红外偏振片，可以评估薄膜的偏振特性和取向。